1 Scope
This part of IEC 61967 provides a test procedure which defines an evaluation method for the near electric,
magnetic or electromagnetic field components at or near the surface of an integrated
circuit (IC). This diagnostic procedure is intended for IC architectural analysis
such as floor planning and power distribution optimization. This test procedure is
applicable to measurements on an IC mounted on any circuit board that is accessible
to the scanning probe. In some cases it is useful to scan not only the IC but also
its environment. For comparison of surface scan emissions between different ICs, the
standardized test board defined in IEC 61967‑1 should be used.
This measurement method provides a mapping of the electric or magnetic near-field
emissions over the IC. The resolution of the measurement is determined by the capability
of the measurement probe and the precision of the probe-positioning system. This method
is intended for use up to 6 GHz. Extending the upper limit of frequency is possible
with existing probe technology but is beyond the scope of this specification. Measurements
may be carried out in the frequency domain or in the time domain.
Открыть превью (PDF)Integrated circuits. Measurement of electromagnetic emissions - Measurement of radiated emissions. Surface scan method
