Overview
IEC 61967-4:2002 is an international standard developed by the International Electrotechnical Commission (IEC) for evaluating the electromagnetic emissions of integrated circuits (ICs) in the frequency range of 150 kHz to 1 GHz. Specifically, Part 4 of this series details the measurement of conducted emissions using the 1 ohm/150 ohm direct coupling method. This standard specifies procedures for directly measuring radio-frequency (RF) currents with a 1 ohm resistive probe and RF voltages using a 150 ohm coupling network, ensuring highly repeatable and correlated results. The latest consolidated version includes modifications from Amendment 1:2006 and the corrigendum of June 2017.
Key Topics
-
Conducted Emission Measurement Methods:
The standard outlines two main approaches for measuring conducted electromagnetic emissions from ICs:
- Direct RF current measurement using a 1 ohm resistive probe
- RF voltage measurement via a 150 ohm direct coupling network
-
Test Environment and Equipment:
- Requirements for RF current probes and voltage coupling networks
- Specifications for test receivers and supporting instrumentation
- Guidance on test board layout and general test configurations to maximize repeatability
-
Repeatability and Correlation:
The document emphasizes the importance of establishing standardized procedures that yield consistent, comparable results across different laboratories and measurement setups.
-
Measurement Frequency Range:
Focused on IC emissions from 150 kHz to 1 GHz, addressing both low and high-frequency disturbances relevant for EMC compliance.
-
Test Reporting:
Standardizes the format and critical content required in test reports for comparison and regulatory purposes.
Applications
-
Semiconductor Manufacturers:
Ensuring compliance with electromagnetic compatibility (EMC) requirements during IC design and validation.
-
EMC Testing and Certification:
Providing testing laboratories with a proven, replicable method to measure and document conducted emissions, essential for product certification and market approval.
-
Automotive and Industrial Electronics:
Used in sectors where conducted emissions standards are mandatory, such as automotive ECUs and industrial control modules, to meet strict EMC regulations.
-
Research and Development:
Assists engineers and researchers in benchmarking the conducted emission performance of new IC designs or system-level prototypes.
Related Standards
-
IEC 61967-1: Integrated circuits - General conditions and definitions for measurement methods.
Provides general guidelines and definitions applicable to all parts in the IEC 61967 series.
-
IEC 61000-4-6: Electromagnetic compatibility (EMC) - Immunity to conducted disturbances induced by radio-frequency fields.
Guides the immunity testing environment relevant to the emissions measured in IEC 61967-4.
-
CISPR 16 Series: Specifications for radio disturbance and immunity measuring apparatus and methods.
Key references for receiver and measurement system requirements.
-
Other IEC 61967 Parts:
- Part 2: Measurement of radiated emissions - TEM cell method
- Part 3: Surface scan method for radiated emissions
- Part 5: Workbench Faraday cage method for conducted emissions
- Part 6: Magnetic probe method for conducted emissions
Practical Value
Implementing IEC 61967-4 enables organizations to:
- Compare conducted emission results reliably across different test sites
- Streamline the compliance process for ICs used in sensitive applications
- Reduce EMC-related issues during product development and after deployment
- Demonstrate adherence to international EMC standards, supporting global market access
By following the standardized test methods in IEC 61967-4, manufacturers and testing labs can ensure their integrated circuits meet electromagnetic emission performance requirements, supporting product quality and regulatory success.
