SIST-TS CEN ISO/TS 23302:2022 PDF

Nanotechnologies - Requirements and recommendations for the identification of measurands that characterise nano-objects and materials that contain them (ISO/TS 23302:2021)

Название (английский):

SIST-TS CEN ISO/TS 23302:2022

Nanotechnologies - Requirements and recommendations for the identification of measurands that characterise nano-objects and materials that contain them (ISO/TS 23302:2021)

Статус документа:: Действующий
Формат:: Электронный (PDF)
Количество страниц:: 79
Дата публикации:: 10 октября 2022 г.
Издание:: ISO/TS 23302:2021
ICS:: 07.120

Язык документа:

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Срок поставки:14 раб. дн. (перевод)

Цена:1 185 €

Описание (английский):

This document specifies requirements and recommendations for the identification of measurands to characterize nano-objects and their agglomerates and aggregates, and to assess specific properties relevant to the performance of materials that contain them. It provides recommendations for relevant measurement.

Технические детали

Технический комитет: I13 - Imaginarni 13
SKU: SIST-TS CEN ISO/TS 23302:2022

Abstract

Overview

CEN ISO/TS 23302:2022 (ISO/TS 23302:2021) is a technical specification for nanotechnologies that defines requirements and recommendations for identifying measurands used to characterize nano‑objects, their agglomerates/aggregates, and materials that contain them. It provides a structured procedure to select measurands and gives measurement recommendations across different sample states (aerosols, powders, liquid dispersions, surfaces) to support consistent characterization and assessment of performance‑relevant properties.

Key topics and technical requirements

Measurand identification procedure: a systematic approach to decide which measurands are needed for a given nano‑object/material and purpose (e.g., sizing, surface chemistry, state).
Types of measurands: metrics related to size and shape, surface chemistry, agglomeration/aggregation state, and other properties that affect material performance.
State‑specific guidance: recommended measurands and measurement approaches tailored to sample forms:
- Aerosols: techniques and considerations for airborne nano‑objects (e.g., cascade impactors, differential mobility analyzers, optical counters, aerodynamic sizing).
- Powders: particle sizing and morphology approaches (e.g., laser diffraction, BET gas adsorption, electron microscopy).
- Liquid dispersions: sizing and fractionation methods (e.g., dynamic light scattering, centrifugal sedimentation, field flow fractionation, particle tracking, single‑particle ICP‑MS).
- Surfaces: microscopy and topography techniques (e.g., scanning electron microscopy (SEM), atomic force microscopy (AFM)).
Chemical and surface analysis: measurands for elemental and surface chemistry assessment (e.g., X‑ray diffraction, Raman spectroscopy, Auger/ESCA methods referenced).
Reference to relevant measurement standards: the document points to established measurement standards and best practices for each technique to support reproducibility and comparability.

Overview

Key topics and technical requirements

Measurand identification procedure: a systematic approach to decide which measurands are needed for a given nano‑object/material and purpose (e.g., sizing, surface chemistry, state).
Types of measurands: metrics related to size and shape, surface chemistry, agglomeration/aggregation state, and other properties that affect material performance.
State‑specific guidance: recommended measurands and measurement approaches tailored to sample forms:
- Aerosols: techniques and considerations for airborne nano‑objects (e.g., cascade impactors, differential mobility analyzers, optical counters, aerodynamic sizing).
- Powders: particle sizing and morphology approaches (e.g., laser diffraction, BET gas adsorption, electron microscopy).
- Liquid dispersions: sizing and fractionation methods (e.g., dynamic light scattering, centrifugal sedimentation, field flow fractionation, particle tracking, single‑particle ICP‑MS).
- Surfaces: microscopy and topography techniques (e.g., scanning electron microscopy (SEM), atomic force microscopy (AFM)).
Chemical and surface analysis: measurands for elemental and surface chemistry assessment (e.g., X‑ray diffraction, Raman spectroscopy, Auger/ESCA methods referenced).
Reference to relevant measurement standards: the document points to established measurement standards and best practices for each technique to support reproducibility and comparability.

SIST-TS CEN ISO/TS 23302:2022 PDF

Технические детали

Abstract

Overview

Key topics and technical requirements

Abstract

Overview

Key topics and technical requirements

Applications and users

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