What is PD IEC/TR 61967-1-1 - Near-field scan about?
PD IEC/TR 61967-1-1 guidelines can be used for integrated circuits. PD IEC/TR 61967-1-1 provides guidance for exchanging data generated by near-field scan measurements. The described exchange format could also be used for near-field scan data generated by simulation or computation software. It should be noted that, although it has been developed for near-field, scans, its use is not restricted to this application. The exchange format can be applied to emission and immunity near-field scan data in the frequency, and time domains.
The scope of PD IEC/TR 61967-1-1 does not include the methods used for the measurements nor simulations nor the software, and algorithms used for generating the exchange file or for processing or viewing the data contained therein.
Who is PD IEC/TR 61967-1-1 - Near-field scan for ?
PD IEC/TR 61967-1-1 on integrated circuits is useful for:
Manufacturers of automotive parts
Manufacturers of electronic devices
Manufacturers of semiconductors devices
Electronic engineers
Why should you use PD IEC/TR 61967-1-1 - Near-field scan ?
Using PD IEC/TR 61967-1-1 you can ensure the Near-field scan (NFS) files are parsed correctly by a Near-field scan (NFS) parser. PD IEC/TR 61967-1-1 provides you with file structure which helps in storing the exchanged information in a single XML file or in several XML, and data files. This near field is useful in scanning the data that may be based on Cartesian, cylindrical or spherical coordinate systems. Data syntax me...
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