IEC TS 61169-1-7:2025 PDF

Radio-frequency connectors - Part 1-7: Electrical test methods - Uncertainty specification of frequency domain test for insertion loss

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IEC TS 61169-1-7:2025

Radio-frequency connectors - Part 1-7: Electrical test methods - Uncertainty specification of frequency domain test for insertion loss

Статус документа:: Действующий
Формат:: Электронный (PDF)
Количество страниц:: 11
Дата публикации:: 27 августа 2025 г.
Издание:: IEC TS 61169 edition 1 version 1
ICS:: 33.120.30

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Срок поставки:2 раб. дн. (перевод)

Цена:165 €

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IEC TS 61169-1-7:2025 relates to radio frequency connectors for RF transmission lines for use in telecommunications, electronics and similar equipment. This document sets out the provisions for a report on the uncertainty specifications for insertion loss measurements, which apply to individual connector types, by vector network analyzers (VNAs). It is intended to establish concepts and procedures considering – testing and measuring procedures concerning frequency domain electrical properties, and – uncertainty specifications of VNAs measurements for insertion loss of RF connectors. The test methods and procedures of this document are intended for acceptance and type approval testing.

Технические детали

Технический комитет: SC 46F - RF and microwave passive components
SKU: IEC TS 61169-1-7:2025

Abstract

Overview

IEC TS 61169-1-7:2025 is a Technical Specification for radio‑frequency connectors that defines how to report and quantify measurement uncertainty of insertion loss in frequency‑domain tests performed with vector network analyzers (VNAs). It complements the IEC 61169 series by focusing specifically on uncertainty specification for insertion loss measurements used in acceptance and type‑approval testing of RF connectors in telecommunications and electronic equipment.

Key topics

Scope and purpose: Procedures and concepts for uncertainty reporting of insertion loss measurements on individual connector types using VNAs.
Parameter definitions: Transmission coefficient representation T = a + jb and insertion loss formula: Insertion loss = −20 log(|T|) (dB).
VNA calibration uncertainty: Identification of residual error terms (directivity, match, tracking, isolation) and how calibration standards and methods affect measurement uncertainty.
Report characteristics: What to include in a connector‑type insertion loss report (frequency dependence, grades, and applicable conditions).
Uncertainty contributors:
- Calibration residual errors (e.g., match error, directivity)
- Instrumentation sources (linearity, isolation, random errors)
- Measurement conditions (noise floor/trace noise, mating interface defects such as pin recession or scratches)
Uncertainty evaluation: Use of ISO/IEC Guide 98‑1 principles to calculate expanded uncertainty (≈95 % confidence), and guidance on estimating VNA uncertainty from manufacturer data or higher‑level calibration laboratories.
Informative annex: Practical method to estimate uncertainty from commercial VNA data sheets and calibration certificates.

Applications

This Technical Specification is directly useful for:

Test and calibration laboratories preparing insertion loss reports and uncertainty budgets for RF connectors.
Connector manufacturers performing type‑approval and production acceptance testing.
Procurement and QA teams defining acceptance criteria tied to measured values plus uncertainty.
R&D and design engineers who need realistic measurement uncertainty to validate connector performance.
Certification bodies and compliance engineers assessing conformance to RF connector electrical requirements.

Practical benefits include improved comparability of insertion loss data, robust acceptance criteria that account for measurement uncertainty, and clearer requirements for VNA calibration and test setup.

Related standards

IEC 61169‑1:2013 (generic RF connector requirements)
ISO/IEC Guide 98‑1 (evaluation of measurement uncertainty)
IEC 60027, IEC 60050, IEC 60617, ISO 80000‑1 (units, symbols, terminology)

Keywords: IEC TS 61169-1-7:2025, insertion loss, VNA calibration uncertainty, radio-frequency connectors, RF connectors, frequency domain test, measurement uncertainty, acceptance testing.

Overview

Key topics

Scope and purpose: Procedures and concepts for uncertainty reporting of insertion loss measurements on individual connector types using VNAs.
Parameter definitions: Transmission coefficient representation T = a + jb and insertion loss formula: Insertion loss = −20 log(|T|) (dB).
VNA calibration uncertainty: Identification of residual error terms (directivity, match, tracking, isolation) and how calibration standards and methods affect measurement uncertainty.
Report characteristics: What to include in a connector‑type insertion loss report (frequency dependence, grades, and applicable conditions).
Uncertainty contributors:
- Calibration residual errors (e.g., match error, directivity)
- Instrumentation sources (linearity, isolation, random errors)
- Measurement conditions (noise floor/trace noise, mating interface defects such as pin recession or scratches)
Uncertainty evaluation: Use of ISO/IEC Guide 98‑1 principles to calculate expanded uncertainty (≈95 % confidence), and guidance on estimating VNA uncertainty from manufacturer data or higher‑level calibration laboratories.
Informative annex: Practical method to estimate uncertainty from commercial VNA data sheets and calibration certificates.

Applications

This Technical Specification is directly useful for:

Test and calibration laboratories preparing insertion loss reports and uncertainty budgets for RF connectors.
Connector manufacturers performing type‑approval and production acceptance testing.
Procurement and QA teams defining acceptance criteria tied to measured values plus uncertainty.
R&D and design engineers who need realistic measurement uncertainty to validate connector performance.
Certification bodies and compliance engineers assessing conformance to RF connector electrical requirements.

Related standards

IEC 61169‑1:2013 (generic RF connector requirements)
ISO/IEC Guide 98‑1 (evaluation of measurement uncertainty)
IEC 60027, IEC 60050, IEC 60617, ISO 80000‑1 (units, symbols, terminology)

Keywords: IEC TS 61169-1-7:2025, insertion loss, VNA calibration uncertainty, radio-frequency connectors, RF connectors, frequency domain test, measurement uncertainty, acceptance testing.

IEC TS 61169-1-7:2025 PDF

Технические детали

Abstract

Overview

Key topics

Applications

Related standards

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Abstract

Overview

Key topics

Applications

Related standards

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