Surface chemical analysis — X-ray fluorescence analysis of particulate matter filters
Открыть превью (PDF)Surface chemical analysis — X-ray fluorescence analysis of particulate matter filtersSurface chemical analysis — X-ray fluorescence analysis of particulate matter filters
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1 Scope This document gives guidance on sample preparation, and on qualitative and quantitative determination of elements in particulate matter collected on filtering membranes (PM filter) by energy dispersive X-ray Fluorescence (EDXRF) in different geometrical configurations. This document does not apply to PM filter sampling. This document only applies to the analysis of X-ray emission from filters that are probed using an X-ray beam as the exciting source. X-ray emissions generated by electron microscope are excluded [ 1 ] . This document is applicable under a range of contexts including, but not limited to, those highlighted in the introduction. The described method is generally applicable for the determination of elements with atomic number higher than 11 (Na) and having a deposited mass on the filter greater than 10 ng. The elements that can be identified and the detection limits depend on the specific instrumental configuration employed. Various types of filtering membranes (filter) materials can be used, such as glass fibre, quartz fibre, cellulose, nylon, polycarbonate (PC) and polytetrafluoroethylene (PTFE). The entire filter, or portions of various sizes thereof, can be submitted for analysis. NOTE Reference free analysis, based on fundamental parameters is excluded, as the nature of the PM filter samples means that the parameters are not sufficiently well defined.
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