BS ISO 14606:2022 PDF
Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials.
ΠΠ°Π·Π²Π°Π½ΠΈΠ΅ (Π°Π½Π³Π»ΠΈΠΉΡΠΊΠΈΠΉ):
BS ISO 14606:2022
Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials.
- Π‘ΡΠ°ΡΡΡ Π΄ΠΎΠΊΡΠΌΠ΅Π½ΡΠ°:
- ΠΠ΅ΠΉΡΡΠ²ΡΡΡΠΈΠΉ
- Π€ΠΎΡΠΌΠ°Ρ:
- ΠΠ»Π΅ΠΊΡΡΠΎΠ½Π½ΡΠΉ (PDF)
- ΠΠΎΠ»ΠΈΡΠ΅ΡΡΠ²ΠΎ ΡΡΡΠ°Π½ΠΈΡ:
- 26
- ΠΠ°ΡΠ° ΠΏΡΠ±Π»ΠΈΠΊΠ°ΡΠΈΠΈ:
- 15 ΡΠ΅Π²ΡΠ°Π»Ρ 2023 Π³.
- SKU:
- BS ISO 14606:2022