BS EN IEC 63287-2:2023 PDF
Semiconductor devices. Guidelines for reliability qualification plans - Concept of mission profile
ΠΡΠΊΡΡΡΡ ΠΏΡΠ΅Π²ΡΡ (PDF)Semiconductor devices. Guidelines for reliability qualification plans - Concept of mission profileSemiconductor devices. Guidelines for reliability qualification plans - Concept of mission profile
- Π‘ΡΠ°ΡΡΡ Π΄ΠΎΠΊΡΠΌΠ΅Π½ΡΠ°:
- ΠΠ΅ΠΉΡΡΠ²ΡΡΡΠΈΠΉ
- Π€ΠΎΡΠΌΠ°Ρ:
- ΠΠ»Π΅ΠΊΡΡΠΎΠ½Π½ΡΠΉ (PDF)
- ΠΠ°ΡΠ° ΠΏΡΠ±Π»ΠΈΠΊΠ°ΡΠΈΠΈ:
- 31 ΠΌΠ°Ρ 2023 Π³.
- ICS:
- 31.080.01
- Π’Π΅Ρ Π½ΠΈΡΠ΅ΡΠΊΠΈΠΉ ΠΊΠΎΠΌΠΈΡΠ΅Ρ:
- CENELEC
- SKU:
- BS EN IEC 63287-2:2023







