BS EN IEC 60749-20:2020 PDF

Semiconductor devices. Mechanical and climatic test methods - Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

Открыть превью (PDF)Semiconductor devices. Mechanical and climatic test methods - Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

Название (английский):

BS EN IEC 60749-20:2020

Semiconductor devices. Mechanical and climatic test methods - Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

Статус документа:

Действующий

Формат:

Электронный (PDF)

Дата публикации:

31 октября 2020 г.

ICS:

31.080.01

SKU:

BS EN IEC 60749-20:2020