ASTM STP36179S PDF

Effects of Oxygen Precipitation on Minority Carrier Lifetime in Silicon Crystals

Название (английский):

ASTM STP36179S

Effects of Oxygen Precipitation on Minority Carrier Lifetime in Silicon Crystals

Формат:: Электронный (PDF)
SKU:: ASTM STP36179S

Цена по запросу

Свяжитесь с нами для уточнения стоимости.

Abstract

Infrared (IR) absorption measurements of the interstitial oxygen concentration [O] for two-step annealed wafers, with reverse recovery time Trr and capacitance relaxation time Ts measurements on processed devices, have been used to investig...

ASTM STP36179S PDF

Abstract

Похожие стандарты

Abstract

Похожие стандарты

Standard Test Method for Strontium in Water

Standard Specification for Ductile Iron Castings

Standard Test Method for Calibration of Primary Non-Concentrator Terrestrial Photovoltaic Reference Cells Usi…

Standard Specification for IFR Operations in IMC for a Light-Sport Aircraft

Standard Specification for Forged or Rolled Alloy and Stainless Steel Pipe Flanges, Forged Fittings, and Valv…

Standard Classification for Specifying Silicone Adhesives and Sealants for Transportation Applications

Standard Practice for Operation and Maintenance of Sewers with Optical Fiber Systems

Standard Specification for Seamless and Welded Titanium and Titanium Alloy Tubes for Condensers and Heat Exch…