Поиск

IEC 60749-8:2002

Действующий

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

Overview IEC 60749-8:2002 is an international standard published by the International Electrotechnical Commission (IEC) that specifies mechanical and climatic test methods focused on the sealing and…

IEC 60749-8:2002/COR2:2003

Действующий

Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

IEC 60749-8:2002/COR1:2003

Действующий

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing