Поиск

IEC 60749-12:2017

Действующий

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

Overview IEC 60749-12:2017 is an international standard published by the International Electrotechnical Commission (IEC) that specifies mechanical test methods for semiconductor devices, focusing on…

Semiconductor devices. Mechanical and climatic test methods - Vibration, variable frequency

What is BS EN IEC 60749-12 - Variable frequency vibration of semiconductor devices about? BS EN IEC 60749 is an international standard on semiconductor devices. BS EN IEC 60749-12 is the 12th part in…

Semiconductor devices - Mechanical and climatic test methods - Part 1: General

Overview IEC 60749-1:2002 is an international standard published by the International Electrotechnical Commission (IEC) focusing on semiconductor devices. This standard provides the general provision…

IEC 60749-1:2002/COR1:2003

Действующий

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General