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BS IEC 60747-16-11:2026

Действующий

Semiconductor devices - Microwave integrated circuits. Power detectors

IEC 60747-16-11:2026

Действующий

Semiconductor devices - Part 16-11: Microwave integrated circuits - Power detectors

Overview IEC 60747-16-11:2026 is the international standard developed by the International Electrotechnical Commission (IEC) for microwave integrated circuit power detectors. This standard establishe…

IEC 60747-16-10:2004

Действующий

Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated ci…

Overview IEC 60747-16-10:2004 - Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (MMICs) - defines the terms, symbols, quality system, test, assessment and verification…