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Semiconductor devices - Part 5-15: Optoelectronic devices - Light emitting diodes - Test method of the flat-band voltage based on the electroreflectance spectroscopy
Cable networks for television signals, sound signals and interactive services - Part 101-1: RF cabling for two-way home networks with all-digital channels load
Tungsten halogen lamps (non vehicle) - Performance specifications
Industrial communication networks - Fieldbus specifications - Part 4-24: Data-link layer protocol specification - Type 24 elements
Digital Test Interchange Format (DTIF)
Methods of measurement of touch current and protective conductor current
Electric cables - Tests on extruded oversheaths with a special protective function
Polyvinyl chloride insulated cables of rated voltages up to and including 450/750 V - Part 1: General requirements
Household and similar electrical appliances - Safety - Part 2-17: Particular requirements for blankets, pads, clothing and similar flexible heating appliances
Laboratory resistors - Part 1: Laboratory DC resistors
Fixed resistors for use in electronic equipment - Part 4: Sectional specification: Power resistors for through hole assembly on circuit boards (THT) or for assembly on chassis
Specifications for particular types of winding wires - Part 62: Polyester glass-fibre wound, silicone resin or varnish impregnated, bare or enamelled rectangular copper wire, temperature index 200
Luminaires - Part 2-17: Particular requirements - Luminaires for stage lighting, television and film studios (outdoor and indoor)
Pressure-sensitive adhesive tapes for electrical purposes - Part 3: Specifications for individual materials - Sheet 7: Polyimide film tapes with pressure-sensitive adhesive
Optical amplifiers - Test methods - Part 1-3: Power and gain parameters - Optical power meter method
Boxes and enclosures for electrical accessories for household and similar fixed electrical installations - Part 24: Particular requirements for enclosures for housing protective devices and other power dissipating elect…
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
Optical fibre cables - Part 1-310: Generic specification - Basic optical cable test procedures - Cable element test methods - Strippability, method G10
Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA
Hearing aids - Part 12: Dimensions of electrical connector systems
